CON1436-02/2023 Multi-Party Framework for the Supply, installation and commissioning electron microscopes including initial contract for a robust, ultra-high resolution FE-SEM with VEM capabilities

Description

The framework agreement will be established on foot of this tender competition for an initial contract which comprises the supply, installation and commissioning of a robust, ultra-high resolution field emission scanning electron microscope (FE-SEM) with Volume Electron Microscopy (VEM) Capabilities. The framework agreement, subject to approval from the competent sources, may also be used for the following types of contracts, as and when they arise. Additional electron microscopes or their associated ancillary and peripheral equipment may arise over the life of the framework and if required, will be subject to mini competition between all framework members: 1. Further Electron Microscopes, including associated ancillary and peripheral equipment. 2. These may comprise: a) Transmission Electron Microscope; b) Scanning Electron Microscope; c) Portable Scanning Electron Microscope 3. Ancillary and peripheral equipment including detectors 4. Equipment that is necessary for the preparation of samples for electron microscopy 5. Unforeseen services which fall clearly within the defined scope of the framework to support the equipment sourced. The framework agreement will be established on foot of this tender competition for an initial contract which comprises the supply, installation and commissioning of a robust, ultra-high resolution field emission scanning electron microscope (FE-SEM) with Volume Electron Microscopy (VEM) Capabilities. The framework agreement, subject to approval from the competent sources, may also be used for the following types of contracts, as and when they arise. Additional electron microscopes or their associated ancillary and peripheral equipment may arise over the life of the framework and if required, will be subject to mini competition between all framework members: 1. Further Electron Microscopes, including associated ancillary and peripheral equipment. 2. These may comprise: a) Transmission Electron Microscope; b) Scanning Electron Microscope; c) Portable Scanning Electron Microscope 3. Ancillary and peripheral equipment including detectors 4. Equipment that is necessary for the preparation of samples for electron microscopy 5. Unforeseen services which fall clearly within the defined scope of the framework to support the equipment sourced.