Provision of dedicated Scanning Acoustic Microscopy inspection equipment.

Description

NMIS is in the process of expanding its manufacturing capability into the semiconductor advanced packaging area with specific focus on power electronic semiconductors. To support this expansion, NMIS intends to procure equipment that is flexible to support a wide variety of power electronic semiconductor designs and packaging requirements. The focus of this an upcoming ITT will be procuring equipment to support Scanning Acoustic Microscopy inspection capabilities along with any and all associated ancillaries required. NMIS is in the process of expanding its manufacturing capability into the semiconductor advanced packaging area with specific focus on power electronic semiconductors. To support this expansion, NMIS intends to procure equipment that can support a wide variety of power electronic semiconductor designs and packaging requirements. The concept design for the facility includes provision of equipment that is sufficiently flexible to support a wide variety of power electronic semiconductor designs and packaging requirements. The items procured will enable NMIS to set up a research facility for developing and scaling-up advanced packaging capabilities for power electronic semiconductors. The overall facility will have capability to prepare, dice/cut, bond, interconnect, package, and test semiconductor products that are part of the power electronics sector. These stages will be carried out across dedicated research and development cells. The focus of this an upcoming ITT will be procuring equipment to support acoustic microscopy inspection capabilities along with any and all associated ancillaries required. The University is seeking a supplier to supply, deliver, install, and commission the equipment. We require a C-SAM (scanning acoustic microscope) capability to support manufacturing in our Advanced Semiconductor Packaging Line. C-SAM is required to non-destructively inspect work-pieces at various stages of our semiconductor packaging process. We require a machine that can accept samples approximately 500 x 500 mm, and is suitable for use in a semiconductor manufacturing context to detect delamination and other structural discontinuities in semiconductor packages. Machine outputs should include high resolution C-Scan images, and possibly A- and B- scan images.