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Provision of Electron Microscopes (S/TEM and FIB-SEM) for The Bridge

Published

Value

1,150,000 GBP

Description

The University has obtained tenders for a combined requirement of a both a scanning transmission electron microscope (S/TEM) and a focussed ion beam scanning electron microscope (FIB-SEM) for The Bridge project. This project is externally funded by the European Regional Development Fund along with the Greater Lincolnshire Local Enterprise Partnership via the Single Local Growth Fund. Lot 1: The University has obtained tenders for a combined requirement for both a scanning transmission electron microscope (S/TEM) and a focussed ion beam scanning electron microscope (FIB-SEM). A single supplier has been sought for both the S/TEM and FIB-SEM. The project is externally funded by the European Regional Development Fund along with the Greater Lincolnshire Local Enterprise Partnership via the Single Local Growth Fund. A fixed budget of £1.15m (excluding VAT) applies for this tender. To respond to this opportunity please click here: https://www.delta-esourcing.com/respond/Y6YNJKKC87 Lot 1: The University has obtained tenders for a combined requirement for both a scanning transmission electron microscope (S/TEM) and a focussed ion beam scanning electron microscope (FIB-SEM). A single supplier has been sought for both the S/TEM and FIB-SEM. The project is externally funded by the European Regional Development Fund along with the Greater Lincolnshire Local Enterprise Partnership via the Single Local Growth Fund. A fixed budget of £1.15m (excluding VAT) applies for this tender. To respond to this opportunity please click here: https://www.delta-esourcing.com/respond/Y6YNJKKC87

Timeline

Close date

2 years ago

Publish date

2 years ago

Buyer information

University of Lincoln

Contact:
Roger Holloway
Email:
rholloway@lincoln.ac.uk

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Notice topics

Darkfield and scanning probe microscopesElectron microscopesScanning electron microscopesScanning probe microscopesTransmission electron microscope

Related topics

Scanning probe microscopesDarkfield microscopesDarkfield and scanning probe microscopesTransmission electron microscopeScanning electron microscopesElectron microscopes

Source

Ted (OJEU)
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