X-ray diffractometer (XRD)

Description

This tender is for the acquisition of a multipurpose high-resolution X-ray diffractometer (XRD) system intended for a university facility, which provides access to an extensive suite of characterization tools as one of its core purposes. The facility caters to users from various levels of experience and tech-nical backgrounds within the university and serves commercial customers as well. Lot 1: Instrument Specifications: The instrument configuration must be a vertical diffractometer with horizontal sample mounting. The goniometer should support an in-plane (non-coplanar) arm and allow uncoupled movements of the source (ω), in-plane (coplanar/2θχ), and out-of-plane (2θ) arms. Additionally, the sample stage should support tilt (χ) and rotation (ϕ). Techniques to be Supported: The instrument will be used for the following techniques: • Reciprocal space mapping (RSM) • X-ray reflectivity (XRR) • In-Plane Diffraction (2θχ, ϕ/2θχ) • Grazing incidence XRD (2θ scans) • HRXRD (high-resolution rocking curves, etc.) • Phase analysis (coupled and uncoupled θ/2θ and 2θ/ω scans) • Residual stress measurements • Texture analysis • Other options requiring dedicated focusing solutions, such as micro-area XRD, may also be considered. Radiation Source: The instrument is intended to have a rotating anode that produces monochromatic Cu Kα radiation. It should support switchable Bragg-Brentano (divergent beam) and Parallel Beam configurations and include a solution for point focus. To eliminate Cu Kα2 and improve angular resolution in HRXRD, an incident beam monochromator and receiving analyzer need to be provided. Detector Requirements: The detector should support 0D, 1D, and 2D measurement modes to eliminate the inconvenience of preparing and switching individual detectors for different applications. It must possess a large active area, small pixel size, and fluorescence suppression. The detector's orientation must be changeable from vertical to horizontal mounting. Sample Handling: The instrument will perform XRD analysis on a variety of samples with varying shapes, textures, and sizes, including powders and thin films. Versatile sample holders must be included to enable the analysis of samples ranging from tiny amounts of powders and small chips to 150 mm wafers. A mapping option is needed to measure points sequentially across larger samples with high accuracy. Another desired feature includes optical imaging of the sample and easy and accurate navigation to desired measurement positions identified through the camera. Automation and User-Friendly Interface: Given the multi-user environment, it is essential that the operation procedure is highly automated. Manual handling of slits, monochromators, focusing mirrors, etc., should be minimized. Additionally, simple guided routines for optics and sample alignment and the most common types of measurement are expected to facilitate safe operation by new users with little or no experience after proper training. The instrument must be largely operated by means of a computer with software featuring a dedicated user-friendly interface. Data Processing and Network Solution: Comprehensive routines for powder XRD, evaluation of HRXRD and XRR, texture analysis, and stress evaluation should be included to process the acquired data. To accommodate multiple users, a network solution or similar approach must be provided to guarantee simultaneous access to data analysis. The software solutions should be intuitive and straightforward to use, considering the intended number of users.